A Method of Improving the Reliability of the Gateway System by Using OSEK/VDX

Year of publication

2007

Journal

International Conference on Control, Automation and Systems, Seoul COEX

Page

2838-2843

Author

Jin-Ho Kim, Suk-Hyun Seo, Tae-Yoon Moon, Sung-Ho Hwang, and Jae Wook Jeon